XTBG OpenIR  > 西园专利
多参数勃鲁莱氏测高器刻度盘
陈爱国
1999-11
Rights Holder中国科学院
Date Available2012-12-03
Country中国
Abstract本实用新型公开了一种多参数勃鲁莱氏测高器 刻度盘。在原勃鲁莱氏测高器主体结构架上,高度刻度盘位置处 设置一多参数刻度盘(4),其上刻有仰、俯角余弦值刻度线(6)。 采用本实用新型可使勃鲁莱氏测高器能够在更为复杂的地 形、地貌条件下,方便、快捷、准确地测量物体的高度。特别是 林业教学、生产、科研部门用这种带有多参数刻度盘的勃鲁莱 氏测高器,在水平距离不易测得情况下测量立木高度十分简 捷、准确度高。
Application Date1998-10
Patent NumberCN2347138
Language中文
Application NumberCN98245484
Patent Agent云南协立专利事务所
Document Type专利
Identifierhttps://ir.xtbg.ac.cn/handle/353005/3690
Collection西园专利
Recommended Citation
GB/T 7714
陈爱国. 多参数勃鲁莱氏测高器刻度盘. CN2347138[P]. 1999-11-01.
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